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Simple analysis of transient photoconductivity for determination of localized‐state distributions in amorphous semiconductors using Laplace transform
1.J. Orenstein and M. Kastner, Phys. Rev. Lett. 46, 1421 (1981).
2.C. Main, R. Brüggemann, D. P. Webb, and S. Reynolds, Solid State Commun. 83, 401 (1992).
3.H. Naito, J. Ding, and M. Okuda, Appl. Phys. Lett. 64, 1830 (1994).
4.J. Ding, H. Naito, M. Okuda and T. Dohmaru, Denshi-Shashin Gakkaishi 33, 135 (1994).
5.M. L. James, G. M. Smith, and J. C. Wolford, Applied Numerical Methods for Digital Computation (Harper and Row, New York, 1977), p. 343.
6.D. C. Look, in Semiconductors and Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1983), Vol. 19.
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