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Modeling electromigration‐induced stress evolution in confined metal lines
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10.1063/1.360281
/content/aip/journal/jap/78/2/10.1063/1.360281
http://aip.metastore.ingenta.com/content/aip/journal/jap/78/2/10.1063/1.360281
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/content/aip/journal/jap/78/2/10.1063/1.360281
1995-07-15
2014-07-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Modeling electromigration‐induced stress evolution in confined metal lines
http://aip.metastore.ingenta.com/content/aip/journal/jap/78/2/10.1063/1.360281
10.1063/1.360281
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