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Stoichiometric low‐temperature GaAs and AlGaAs: A reflection high‐energy electron‐diffraction study
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10.1063/1.359856
/content/aip/journal/jap/78/7/10.1063/1.359856
http://aip.metastore.ingenta.com/content/aip/journal/jap/78/7/10.1063/1.359856
/content/aip/journal/jap/78/7/10.1063/1.359856
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/content/aip/journal/jap/78/7/10.1063/1.359856
1995-10-01
2014-07-12
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Stoichiometric low‐temperature GaAs and AlGaAs: A reflection high‐energy electron‐diffraction study
http://aip.metastore.ingenta.com/content/aip/journal/jap/78/7/10.1063/1.359856
10.1063/1.359856
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