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Consistent quantitative model for the spatial extent of point defect interactions in silicon
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10.1063/1.359708
/content/aip/journal/jap/78/9/10.1063/1.359708
http://aip.metastore.ingenta.com/content/aip/journal/jap/78/9/10.1063/1.359708
/content/aip/journal/jap/78/9/10.1063/1.359708
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/content/aip/journal/jap/78/9/10.1063/1.359708
1995-11-01
2014-12-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Consistent quantitative model for the spatial extent of point defect interactions in silicon
http://aip.metastore.ingenta.com/content/aip/journal/jap/78/9/10.1063/1.359708
10.1063/1.359708
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