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Characterization of excimer laser annealed polycrystalline alloy thin films by x-ray diffraction and spectroscopic ellipsometry
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10.1063/1.366670
/content/aip/journal/jap/83/1/10.1063/1.366670
http://aip.metastore.ingenta.com/content/aip/journal/jap/83/1/10.1063/1.366670
/content/aip/journal/jap/83/1/10.1063/1.366670
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/content/aip/journal/jap/83/1/10.1063/1.366670
1998-01-01
2015-07-06
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of excimer laser annealed polycrystalline Si1−xGex alloy thin films by x-ray diffraction and spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/jap/83/1/10.1063/1.366670
10.1063/1.366670
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