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Electronically enhanced kink motion on 30° partial dislocations in Ge directly observed by plan-view high resolution electron microscopy
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10.1063/1.366920
/content/aip/journal/jap/83/4/10.1063/1.366920
http://aip.metastore.ingenta.com/content/aip/journal/jap/83/4/10.1063/1.366920
/content/aip/journal/jap/83/4/10.1063/1.366920
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/content/aip/journal/jap/83/4/10.1063/1.366920
1998-02-15
2014-09-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electronically enhanced kink motion on 30° partial dislocations in Ge directly observed by plan-view high resolution electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/83/4/10.1063/1.366920
10.1063/1.366920
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