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Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
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10.1063/1.368346
/content/aip/journal/jap/84/4/10.1063/1.368346
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/4/10.1063/1.368346
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/content/aip/journal/jap/84/4/10.1063/1.368346
1998-08-15
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/4/10.1063/1.368346
10.1063/1.368346
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