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Correlation between structure, microstructure, and ferroelectric properties of integrated film: Influence of the sol-gel process and the substrate
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10.1063/1.368560
/content/aip/journal/jap/84/7/10.1063/1.368560
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/7/10.1063/1.368560
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/content/aip/journal/jap/84/7/10.1063/1.368560
1998-10-01
2014-09-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation between structure, microstructure, and ferroelectric properties of PbZr0.2Ti0.8O3 integrated film: Influence of the sol-gel process and the substrate
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/7/10.1063/1.368560
10.1063/1.368560
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