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Characterization of three-dimensional grain boundary topography in a thin film bicrystal grown on a substrate
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10.1063/1.368736
/content/aip/journal/jap/84/9/10.1063/1.368736
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/9/10.1063/1.368736
/content/aip/journal/jap/84/9/10.1063/1.368736
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/content/aip/journal/jap/84/9/10.1063/1.368736
1998-11-01
2015-02-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of three-dimensional grain boundary topography in a YBa2Cu3O7−d thin film bicrystal grown on a SrTiO3 substrate
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/9/10.1063/1.368736
10.1063/1.368736
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