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Microscopic analysis of the influence of strain and band-gap offsets on noise characteristics in heterojunctions
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10.1063/1.368748
/content/aip/journal/jap/84/9/10.1063/1.368748
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/9/10.1063/1.368748
/content/aip/journal/jap/84/9/10.1063/1.368748
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/content/aip/journal/jap/84/9/10.1063/1.368748
1998-11-01
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microscopic analysis of the influence of strain and band-gap offsets on noise characteristics in Si1−xGex/Si heterojunctions
http://aip.metastore.ingenta.com/content/aip/journal/jap/84/9/10.1063/1.368748
10.1063/1.368748
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