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Characterization of ion beam and magnetron sputtered thin Ta/NiFe films
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10.1063/1.370124
/content/aip/journal/jap/85/8/10.1063/1.370124
http://aip.metastore.ingenta.com/content/aip/journal/jap/85/8/10.1063/1.370124
/content/aip/journal/jap/85/8/10.1063/1.370124
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/content/aip/journal/jap/85/8/10.1063/1.370124
1999-04-15
2014-10-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of ion beam and magnetron sputtered thin Ta/NiFe films
http://aip.metastore.ingenta.com/content/aip/journal/jap/85/8/10.1063/1.370124
10.1063/1.370124
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