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Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams
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10.1063/1.371507
/content/aip/journal/jap/86/9/10.1063/1.371507
http://aip.metastore.ingenta.com/content/aip/journal/jap/86/9/10.1063/1.371507
/content/aip/journal/jap/86/9/10.1063/1.371507
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/content/aip/journal/jap/86/9/10.1063/1.371507
1999-11-01
2014-10-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams
http://aip.metastore.ingenta.com/content/aip/journal/jap/86/9/10.1063/1.371507
10.1063/1.371507
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