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Complete thermal characterization of film-on-substrate system by modulated thermoreflectance microscopy and multiparameter fitting
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10.1063/1.371520
/content/aip/journal/jap/86/9/10.1063/1.371520
http://aip.metastore.ingenta.com/content/aip/journal/jap/86/9/10.1063/1.371520
/content/aip/journal/jap/86/9/10.1063/1.371520
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/content/aip/journal/jap/86/9/10.1063/1.371520
1999-11-01
2015-08-04
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Complete thermal characterization of film-on-substrate system by modulated thermoreflectance microscopy and multiparameter fitting
http://aip.metastore.ingenta.com/content/aip/journal/jap/86/9/10.1063/1.371520
10.1063/1.371520
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