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Spectroellipsometric characterization of plasma-deposited nanocomposite films
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10.1063/1.371849
/content/aip/journal/jap/87/1/10.1063/1.371849
http://aip.metastore.ingenta.com/content/aip/journal/jap/87/1/10.1063/1.371849
/content/aip/journal/jap/87/1/10.1063/1.371849
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/content/aip/journal/jap/87/1/10.1063/1.371849
2000-01-01
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spectroellipsometric characterization of plasma-deposited Au/SiO2 nanocomposite films
http://aip.metastore.ingenta.com/content/aip/journal/jap/87/1/10.1063/1.371849
10.1063/1.371849
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