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Spatial variation of ferroelectric properties in thin films studied by atomic force microscopy
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10.1063/1.373492
/content/aip/journal/jap/87/11/10.1063/1.373492
http://aip.metastore.ingenta.com/content/aip/journal/jap/87/11/10.1063/1.373492
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/content/aip/journal/jap/87/11/10.1063/1.373492
2000-06-01
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spatial variation of ferroelectric properties in Pb(Zr0.3, Ti0.7)O3 thin films studied by atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/87/11/10.1063/1.373492
10.1063/1.373492
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