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Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scattering
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10.1063/1.371997
/content/aip/journal/jap/87/3/10.1063/1.371997
http://aip.metastore.ingenta.com/content/aip/journal/jap/87/3/10.1063/1.371997
/content/aip/journal/jap/87/3/10.1063/1.371997
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/content/aip/journal/jap/87/3/10.1063/1.371997
2000-02-01
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scattering
http://aip.metastore.ingenta.com/content/aip/journal/jap/87/3/10.1063/1.371997
10.1063/1.371997
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