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Trapping and detrapping of electrons photoinjected from silicon to ultrathin overlayers. I. In vacuum and in the presence of ambient oxygen
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10.1063/1.373753
/content/aip/journal/jap/88/2/10.1063/1.373753
http://aip.metastore.ingenta.com/content/aip/journal/jap/88/2/10.1063/1.373753
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/content/aip/journal/jap/88/2/10.1063/1.373753
2000-07-15
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Trapping and detrapping of electrons photoinjected from silicon to ultrathin SiO2 overlayers. I. In vacuum and in the presence of ambient oxygen
http://aip.metastore.ingenta.com/content/aip/journal/jap/88/2/10.1063/1.373753
10.1063/1.373753
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