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Electron microscopy and Rutherford backscattering study of nucleation and growth in nanosized W–Ti–O thin films
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10.1063/1.373782
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    Affiliations:
    1 Dipartimento di Fisica and INFM Università di Ferrara, Via Paradiso 12, I-44100 Ferrara, Italy
    2 Dipartimento di Chimica e Fisica dei Materiali and INFM Università di Brescia, Via Valotti 9, I-25133 Brescia, Italy
    3 Laboratori Nazionali Legnaro, INFN, Via Romea 4, 35020 Legnaro (Padova), Italy
    4 and Dipartimento di Fisica and INFM, Università di Padova, Via Marzolo 8, I-35131 Padova, Italy
    5 Dipartimento di Ingegneria dei Materiali, Università di Trento, 38050 Mesiano (Trento), Italy
    J. Appl. Phys. 88, 1097 (2000); http://dx.doi.org/10.1063/1.373782
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/content/aip/journal/jap/88/2/10.1063/1.373782
2000-07-15
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electron microscopy and Rutherford backscattering study of nucleation and growth in nanosized W–Ti–O thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/88/2/10.1063/1.373782
10.1063/1.373782
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