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High temperature stability in lanthanum and zirconia-based gate dielectrics
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10.1063/1.1391418
/content/aip/journal/jap/90/7/10.1063/1.1391418
http://aip.metastore.ingenta.com/content/aip/journal/jap/90/7/10.1063/1.1391418
/content/aip/journal/jap/90/7/10.1063/1.1391418
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/content/aip/journal/jap/90/7/10.1063/1.1391418
2001-10-01
2014-12-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High temperature stability in lanthanum and zirconia-based gate dielectrics
http://aip.metastore.ingenta.com/content/aip/journal/jap/90/7/10.1063/1.1391418
10.1063/1.1391418
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