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X-ray diffraction analysis of a selectively grown InGaAsP epitaxial layer
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10.1063/1.1396830
/content/aip/journal/jap/90/7/10.1063/1.1396830
http://aip.metastore.ingenta.com/content/aip/journal/jap/90/7/10.1063/1.1396830
/content/aip/journal/jap/90/7/10.1063/1.1396830
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/content/aip/journal/jap/90/7/10.1063/1.1396830
2001-10-01
2015-07-04
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray diffraction analysis of a selectively grown InGaAsP epitaxial layer
http://aip.metastore.ingenta.com/content/aip/journal/jap/90/7/10.1063/1.1396830
10.1063/1.1396830
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