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Characterization of reflectivity inversion, α- and β-phase transitions and nanostructure formation in hydrogen activated thin Pd films on silicon based substrates
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10.1063/1.1417992
/content/aip/journal/jap/91/6/10.1063/1.1417992
http://aip.metastore.ingenta.com/content/aip/journal/jap/91/6/10.1063/1.1417992
/content/aip/journal/jap/91/6/10.1063/1.1417992
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/content/aip/journal/jap/91/6/10.1063/1.1417992
2002-03-15
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of reflectivity inversion, α- and β-phase transitions and nanostructure formation in hydrogen activated thin Pd films on silicon based substrates
http://aip.metastore.ingenta.com/content/aip/journal/jap/91/6/10.1063/1.1417992
10.1063/1.1417992
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