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Thermal stability and performance reliability of Pt/Ti/WSi/Ni ohmic contacts to n-SiC for high temperature and pulsed power device applications
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10.1063/1.1450024
/content/aip/journal/jap/91/6/10.1063/1.1450024
http://aip.metastore.ingenta.com/content/aip/journal/jap/91/6/10.1063/1.1450024
/content/aip/journal/jap/91/6/10.1063/1.1450024
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/content/aip/journal/jap/91/6/10.1063/1.1450024
2002-03-15
2015-01-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermal stability and performance reliability of Pt/Ti/WSi/Ni ohmic contacts to n-SiC for high temperature and pulsed power device applications
http://aip.metastore.ingenta.com/content/aip/journal/jap/91/6/10.1063/1.1450024
10.1063/1.1450024
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