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Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
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10.1063/1.1486032
/content/aip/journal/jap/92/1/10.1063/1.1486032
http://aip.metastore.ingenta.com/content/aip/journal/jap/92/1/10.1063/1.1486032
/content/aip/journal/jap/92/1/10.1063/1.1486032
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/content/aip/journal/jap/92/1/10.1063/1.1486032
2002-06-19
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
http://aip.metastore.ingenta.com/content/aip/journal/jap/92/1/10.1063/1.1486032
10.1063/1.1486032
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