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Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties
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10.1063/1.1508427
/content/aip/journal/jap/92/8/10.1063/1.1508427
http://aip.metastore.ingenta.com/content/aip/journal/jap/92/8/10.1063/1.1508427
/content/aip/journal/jap/92/8/10.1063/1.1508427
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/content/aip/journal/jap/92/8/10.1063/1.1508427
2002-10-01
2014-09-03
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties
http://aip.metastore.ingenta.com/content/aip/journal/jap/92/8/10.1063/1.1508427
10.1063/1.1508427
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