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Electromigration model for the prediction of lifetime based on the failure unit statistics in aluminum metallization
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10.1063/1.1528311
/content/aip/journal/jap/93/2/10.1063/1.1528311
http://aip.metastore.ingenta.com/content/aip/journal/jap/93/2/10.1063/1.1528311
/content/aip/journal/jap/93/2/10.1063/1.1528311
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/content/aip/journal/jap/93/2/10.1063/1.1528311
2002-12-27
2014-08-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electromigration model for the prediction of lifetime based on the failure unit statistics in aluminum metallization
http://aip.metastore.ingenta.com/content/aip/journal/jap/93/2/10.1063/1.1528311
10.1063/1.1528311
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