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Measurement of the band offsets of on clean n- and p-type GaN(0001)
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10.1063/1.1559424
/content/aip/journal/jap/93/7/10.1063/1.1559424
http://aip.metastore.ingenta.com/content/aip/journal/jap/93/7/10.1063/1.1559424
/content/aip/journal/jap/93/7/10.1063/1.1559424
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/content/aip/journal/jap/93/7/10.1063/1.1559424
2003-03-21
2014-09-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)
http://aip.metastore.ingenta.com/content/aip/journal/jap/93/7/10.1063/1.1559424
10.1063/1.1559424
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