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Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction
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10.1063/1.1621738
/content/aip/journal/jap/94/11/10.1063/1.1621738
http://aip.metastore.ingenta.com/content/aip/journal/jap/94/11/10.1063/1.1621738
/content/aip/journal/jap/94/11/10.1063/1.1621738
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/content/aip/journal/jap/94/11/10.1063/1.1621738
2003-11-10
2014-08-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction
http://aip.metastore.ingenta.com/content/aip/journal/jap/94/11/10.1063/1.1621738
10.1063/1.1621738
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