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Electrical and chemical characterization of the Schottky barrier formed between clean surfaces and Pt, Au, and Ag
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10.1063/1.1598630
/content/aip/journal/jap/94/6/10.1063/1.1598630
http://aip.metastore.ingenta.com/content/aip/journal/jap/94/6/10.1063/1.1598630
/content/aip/journal/jap/94/6/10.1063/1.1598630
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/content/aip/journal/jap/94/6/10.1063/1.1598630
2003-08-29
2014-12-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical and chemical characterization of the Schottky barrier formed between clean n-GaN(0001) surfaces and Pt, Au, and Ag
http://aip.metastore.ingenta.com/content/aip/journal/jap/94/6/10.1063/1.1598630
10.1063/1.1598630
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