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Influence of Schottky and Poole–Frenkel emission on the retention property of -based metal/ferroelectric/insulator/semiconductor capacitors
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10.1063/1.1601292
/content/aip/journal/jap/94/6/10.1063/1.1601292
http://aip.metastore.ingenta.com/content/aip/journal/jap/94/6/10.1063/1.1601292
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/content/aip/journal/jap/94/6/10.1063/1.1601292
2003-08-29
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of Schottky and Poole–Frenkel emission on the retention property of YMnO3-based metal/ferroelectric/insulator/semiconductor capacitors
http://aip.metastore.ingenta.com/content/aip/journal/jap/94/6/10.1063/1.1601292
10.1063/1.1601292
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