No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Response to comment on “Formation of nanocrystallites governed by the initial stress in the ultrathin hydrogenated amorphous silicon films” [J. Appl. Phys. 90, 1067 (2001)]
1.S. Hazra, I. Sakata, M. Yamanaka, and E. Suzuki, J. Appl. Phys. 90, 1067 (2001).
2.S. Hazra, I. Sakata, M. Yamanaka, and E. Suzuki, Appl. Phys. Lett. 80, 1159 (2002).
3.S. Hazra, I. Sakata, M. Yamanaka, and E. Suzuki, Appl. Phys. Lett. 90, 1067 (2002).
4.H. G. Tompkins and W. A. McGahan, Spectroscopic Ellipsometry and Reflectometry (Wiley, New York, 1998), p. 222.
Article metrics loading...
Full text loading...
Most read this month
Most cited this month