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Response to comment on “Formation of nanocrystallites governed by the initial stress in the ultrathin hydrogenated amorphous silicon films” [J. Appl. Phys. 90, 1067 (2001)]
1.S. Hazra, I. Sakata, M. Yamanaka, and E. Suzuki, J. Appl. Phys. 90, 1067 (2001).
2.S. Hazra, I. Sakata, M. Yamanaka, and E. Suzuki, Appl. Phys. Lett. 80, 1159 (2002).
3.S. Hazra, I. Sakata, M. Yamanaka, and E. Suzuki, Appl. Phys. Lett. 90, 1067 (2002).
4.H. G. Tompkins and W. A. McGahan, Spectroscopic Ellipsometry and Reflectometry (Wiley, New York, 1998), p. 222.
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