XRD pattern of the sample annealed at 800 °C for 30 s.
XRD patterns of the samples annealed at (a) 600 °C, (b) 850 °C, and (c) 9000 °C for 30 s.
Sheet resistance of the and samples as a function of the annealing temperature.
SEM images on the surfaces of samples after annealing at (a) 800 °C, (b) 850 °C, and (c) 900 °C.
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