The lattice parameter as well as the unit cell volume as a function of lanthanum and nionbium dopant concentration (a). The ratio of the -value splitting as well as the angle of the rhombohedral unit cell is shown in a manner (b). The undoped sample is represented by ×.
Typical SEM micrographs of undoped (a), 1.0 (b), 2.0 (c), and (d) doped polished sample surfaces.
Deconvoluted lifetime parameters as a function of (a) and (b) dopant concentration for samples sintered in oxygen for at and in air for at .
Positron annihilation Doppler broadening parameters ( and ) for - (a) and -doped (b) sample sintered under oxygen for at .
core photoelectron emission spectra as a function of doping concentration (a) The -doped as entered (i), after of sputtering (ii), and after an -plasma treatment (iii) is shown in (b).
XPS spectra on for the sample doped with .
Table of the ionic radii after Shannon et al. (refs. 45 and 46).
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