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Columnar tilt and vortex stress in superconducting thin films of : Magnetization critical current-density measurements
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10.1063/1.1812351
/content/aip/journal/jap/96/12/10.1063/1.1812351
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/12/10.1063/1.1812351
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) X-ray diffraction plot of the pristine film. (b) Atomic force microscope image of the pristine film. (c) Variation of resistance with temperature of the pristine film.

Image of FIG. 2.
FIG. 2.

Variation of critical current density with applied field at different ion flux.

Image of FIG. 3.
FIG. 3.

Scanning electron microscope images of the films at different track angles. (a) Pristine, (b) , (c) , (d) , and (e) .

Image of FIG. 4.
FIG. 4.

Magnetic hysteresis loops for films (flux ) at for different defect angles (The magnetization data for 30° and 45° were low in magnitude and nearly merged with the background, hence are not shown for clarity. However, the derived data for and for the same are plotted in the next figures.)

Image of FIG. 5.
FIG. 5.

(a) Variation of critical current density with an effective applied field at for different defect angles for films (flux ). (b) Variation of critical current density with an effective applied field at for different defect angles for films (flux ).

Image of FIG. 6.
FIG. 6.

(a) Variation of volume pinning force with an effective applied field at for different defect angles for films (flux ). (b) Variation of volume pinning force with an effective applied field at for different defect angles for films (flux ).

Image of FIG. 8.
FIG. 8.

Configuration of a staircase vortex along the preferential direction of columnar defects.

Image of FIG. 7.
FIG. 7.

Schematic representation of an oblique beam and the effective field (i.e., ).

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/content/aip/journal/jap/96/12/10.1063/1.1812351
2004-12-02
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Columnar tilt and vortex stress in superconducting thin films of NdBa2Cu3O7−δ: Magnetization critical current-density measurements
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/12/10.1063/1.1812351
10.1063/1.1812351
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