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Effect of constituent phases of reactively sputtered film on recording and readout mechanisms of super-resolution near-field structure disk
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10.1063/1.1767978
/content/aip/journal/jap/96/3/10.1063/1.1767978
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/3/10.1063/1.1767978
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

TEM bright-field images and diffraction patterns of the as-deposited films prepared at oxygen flow ratios of (a) 0.2, (b) 0.5, and (c) 0.7.

Image of FIG. 2.
FIG. 2.

(a) GIXD diffraction patterns of the annealed samples prepared at oxygen flow ratios of 0.2, 0.5, and 0.7. (b) FE-SEM image of the annealed prepared at an oxygen flow ratio of 0.5.

Image of FIG. 3.
FIG. 3.

Dependence of CNR (a) on the readout power, (b) on the mark length in the super-RENS disk.

Image of FIG. 4.
FIG. 4.

TEM image of the multilayer after being irradiated by a blue laser pulse of power for the duration of : (a) 0.2, (b) 0.5, and (c) 0.7.

Image of FIG. 5.
FIG. 5.

Recording and readout mechanisms for the Super-RENS disk with a with an mask layer consisting of (a) an appreciable amount of Ag particles and phase, and (b) .

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/content/aip/journal/jap/96/3/10.1063/1.1767978
2004-07-26
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of constituent phases of reactively sputtered AgOx film on recording and readout mechanisms of super-resolution near-field structure disk
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/3/10.1063/1.1767978
10.1063/1.1767978
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