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Interface structures of thin films sputtered on sapphire - and -plane
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10.1063/1.1769601
/content/aip/journal/jap/96/4/10.1063/1.1769601
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/4/10.1063/1.1769601
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

A set of cross-sectional TEM analyses of layers deposited on sapphire -plane. (a)A bright-field cross-sectional TEM micrograph, (b)–(d) diffraction patterns of layer, interface, and AlN layer.

Image of FIG. 2.
FIG. 2.

A magnified diffraction pattern taken from layer deposited on sapphire -plane.

Image of FIG. 3.
FIG. 3.

A magnified diffraction pattern taken from AlN layer deposited on layer∕sapphire -plane.

Image of FIG. 4.
FIG. 4.

HRTEM image taken from interface boundary of layers deposited on sapphire -plane.

Image of FIG. 5.
FIG. 5.

A set of cross-sectional TEM analyses of layers deposited on sapphire -plane. (a) A bright-field cross-sectional TEM micrograph, (b)–(d) diffraction patterns of layer, interface, and AlN layer.

Image of FIG. 6.
FIG. 6.

Current-voltage curve for the junction fabricated on sapphire -plane.

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/content/aip/journal/jap/96/4/10.1063/1.1769601
2004-08-02
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interface structures of AlN∕MgB2 thin films sputtered on sapphire c- and r-plane
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/4/10.1063/1.1769601
10.1063/1.1769601
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