Dark field (200) cross-sectional TEM images of DWELL samples with (a) and without (b) the high growth temperature spacer layers.
AFM images (inset) and histograms obtained from different dot layers for different growth conditions: (a) and (b) are the first and fifth layers, respectively, of a structure grown with HGTSLs, (c) and (d) the second and fifth layers, respectively, of structures grown without HGTSLs. The AFM image size is .
AFM images of the surface morphology prior to the deposition of the second layer of QDs for structures with (a) and without (b) the high growth temperature spacer layer.
The temperature dependence of the threshold current density under continuous-wave operation of a QD laser incorporating the HGTSLs and with uncoated facets. Lasing spectra at RT and are shown in the insets.
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