Temperature dependence of the sheet resistance of films for samples measured immediately after deposition (open symbols) and one day after deposition (solid symbols).
Temperature dependence of sheet resistance upon annealing single layer of film and films covered with different protective layers having a thickness of . The different protective layers are indicated inside the individual graphs Curves of (a) and (b) were obtained using a heating rate of and , respectively.
Temperature dependence of sheet resistance for of films covered with (a) and (b) measured at different heating rates. The heating rates are shown in the inset. The solid line represents the fit for electronic transport with an energy barrier
Kissinger plots from which the activation energy of the amorphous to crystalline transition at is determined. Plots of a single layer of film (star) and film covered with thick protective layers of (open circles) and (solid squares) are presented. The lines show the linear fit.
Activation energy for electronic transport for different capping layers and heating rates.
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