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Analysis and determination of the stress-optic coefficients of thin single crystal silicon samples
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10.1063/1.1774259
/content/aip/journal/jap/96/6/10.1063/1.1774259
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/6/10.1063/1.1774259
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/content/aip/journal/jap/96/6/10.1063/1.1774259
2004-09-02
2014-07-10
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scitation|Analysis and determination of the stress-optic coefficients of thin single crystal silicon samples
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/6/10.1063/1.1774259
10.1063/1.1774259
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