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Spectroscopic method of strain analysis in semiconductor quantum-well devices
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10.1063/1.1791754
/content/aip/journal/jap/96/8/10.1063/1.1791754
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/8/10.1063/1.1791754
/content/aip/journal/jap/96/8/10.1063/1.1791754
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/content/aip/journal/jap/96/8/10.1063/1.1791754
2004-10-04
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spectroscopic method of strain analysis in semiconductor quantum-well devices
http://aip.metastore.ingenta.com/content/aip/journal/jap/96/8/10.1063/1.1791754
10.1063/1.1791754
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