XRD -scan of the STO 103, SRO 211, SRO 206, and BST 303 peaks indicating a epitaxial relationship.
RBS random (◻) and channeling (엯) spectra of - (a), - (b), and - (c) thick BST films deposited on SRO/STO. The symbols represent the experimental data whereas the solid lines correspond to the simulated spectra. The minimum channeling yields are specified.
Low-magnification lattice fringe images of - (a), - (b), and - (c) thick BST films stacked between - (top) and - (bottom) thick SRO layers. The horizontal arrows denote the SRO/BST and BST/SRO interfaces, the dot lines mark the sublayer interfaces, and the vertical arrows point to planar defects between columnar features. Zone axis is indicated in the left bottom of each image.
Lattice image of -thick BST film shows three dislocations , , and with Burger vectors of , , and , respectively, at the interface between the first -thick sublayer (1L) and the second sublayer (2L).
(a) Lattice images of a -thick BST film stacked between - (top) and - (bottom) thick SRO layers. (b) Map of the lattice distortion along the out-of-plane axis within region displayed in (a). The frames are used to average horizontally the lattice distortion map, so-obtained profiles in arrow direction are shown in (c) and (d). The depth axes correspond to the vertical distance to the upper SRO/BST interface measured in pixel. Profiles of the lattice distortion relative to the SRO lattice within dislocation core (c) and dislocation-free (d) areas. 1L and 2L denote the first and second BST sublayers.
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