Optical microscope image of reflected light from a sample of the first series: a multilayer structure with Al deposited on Al partially covered up with a fine mesh grid. The size of dark squares is . The dark squares represent the parts of the sample coated with nanoparticles and the bright parts were covered up during evaporation by the grid and so do not contain significant amounts of nanoparticles.
Reflection measurements (∎) are shown as a function of layer thickness for multilayer structures Al mirror. Calculations for different indexes of refraction are tested. The index of refraction of bulk Al does not fit the experimental results.
Typical reflection measurements of different layer sequences and comparison of the measured points with the calculated curves for different wavelengths. The influence of the layer parameters on the reflection can clearly be seen. Lines indicate calculations, and symbols represent measurement points. Lines and symbols: (---) (1), (∎) (2): mirror; (—) (3), (◆) (4): mirror; (●) (5) with a trap for the primary light beam: mirror; (▴) (6) mirror; (엯) (7) mirror; (◻) (8) mirror.
Nanoparticles of Al are visible in a square of on a polished quartz substrate. The next square just starts on the right side of the image.
Nanoparticles of Al in an area of on polished quartz. The tracks on the sample were a result of the polishing.
Nanoparticles of Ag are visible in the square of onto a polished quartz substrate.
The AFM image shows a Al layer inside of squares on polished quartz. The sample was rotated during the evaporation of the metal like in spin coating. With the exception of some needles, no isolated nanoparticles can be detected. The shadow of the grid used during coating and a rough Al layer inside of the squares can be seen.
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