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Flux effect on the ion-beam nitriding of austenitic stainless-steel AISI 304L
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10.1063/1.1929093
/content/aip/journal/jap/97/12/10.1063/1.1929093
http://aip.metastore.ingenta.com/content/aip/journal/jap/97/12/10.1063/1.1929093

Figures

Image of FIG. 1.
FIG. 1.

Evolution of the temperature measured at the interface between the backside of the sample and the sample holder ( beneath the irradiated surface) after switching on the ion beam.

Image of FIG. 2.
FIG. 2.

Evolution of nitrogen depth profiles for the current densities of 0.5, 0.67, and [(a), (b), and (c), respectively]. Curves 1–4 correspond to implanted total fluences of 4.4, 8.7, 13.1, and , respectively.

Image of FIG. 3.
FIG. 3.

Typical NRA profile from sample , to illustrate the thickness of the nitrided layer and the thickness of the leading edge.

Image of FIG. 4.
FIG. 4.

Nitrogen penetration depth as function of time for the current densities of 0.5, 0.67, and (curves 1–3, respectively). The lines joining the points are guides for the eyes.

Image of FIG. 5.
FIG. 5.

NRA depth profiles obtained using 0.67 (a) and (b) current densities to implant without (curves 1) and with (curves 2) and (curves 3) pretreatment using .

Image of FIG. 6.
FIG. 6.

The depth of the nitrided layer as a function of fluence for 0.5, 0.67, and [(a), (b), and (c), respectively]. The solid lines represent the fitting results using Eq. (3) with a diffusion coefficient that depends on temperature (with ) and on flux. The dashed curves represent the evolutions of the samples with slightly different temperature evolutions.

Image of FIG. 7.
FIG. 7.

NRA nitrogen profiles for the current densities of 0.5 (a), 0.67 (b), and (c) as measured by NRA (dots), and fitted using Eqs. (9) and (10). The dashed curves represent the calculated nitrogen distribution profiles of the samples with the same but slightly different temperature evolutions.

Image of FIG. 8.
FIG. 8.

NRA nitrogen depth profiles obtained at during (full symbols), and subsequent vacuum annealing at (empty symbols). The lines represent the fitted profiles using the model of trapping–detrapping.

Image of FIG. 9.
FIG. 9.

Evolution of the surface concentration of the detrapped, trapped, and total amount of nitrogen for the current densities of 0.5 (a), 0.67 (b), and (c) as calculated using Eqs. (9) and (10).

Tables

Generic image for table
Table I.

Conditions at varied flux of ion nitriding.

Generic image for table
Table II.

Conditions for different pretreatments using bombardment.

Generic image for table
Table III.

Surface concentrations, nitrided layer depths and , total retained doses, retained doses at , and ratios between retained doses and implanted fluences for flux variation.

Generic image for table
Table IV.

Surface concentrations, nitrided layer depths and , total retained doses, retained doses at , and ratios between retained doses and implanted fluences for variation of pretreatment.

Generic image for table
Table V.

The preexponential factors deduced from the analysis of the time evolution of the nitrided depth.

Generic image for table
Table VI.

The preexponential factors obtained using fitting, full-profile fitting, and their ratio for the different current densities.

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/content/aip/journal/jap/97/12/10.1063/1.1929093
2005-06-22
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Flux effect on the ion-beam nitriding of austenitic stainless-steel AISI 304L
http://aip.metastore.ingenta.com/content/aip/journal/jap/97/12/10.1063/1.1929093
10.1063/1.1929093
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