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Simulation of adsorption-induced stress of a microcantilever sensor
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10.1063/1.1853496
/content/aip/journal/jap/97/4/10.1063/1.1853496
http://aip.metastore.ingenta.com/content/aip/journal/jap/97/4/10.1063/1.1853496

Figures

Image of FIG. 1.
FIG. 1.

Arrangement of atoms (or small molecules) on cantilever surface.

Image of FIG. 2.
FIG. 2.

Position of surface atoms on deflected beam.

Image of FIG. 3.
FIG. 3.

Deflected microcantilever sensor.

Image of FIG. 4.
FIG. 4.

Cantilever deflection vs time; mercury environment (data was taken at ORNL).

Image of FIG. 5.
FIG. 5.

Influence of atomic spacing on tip deflection.

Image of FIG. 6.
FIG. 6.

Relation between force and potential field.

Tables

Generic image for table
Table I.

Effects of Lennard–Jones constants on beam curvature.

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/content/aip/journal/jap/97/4/10.1063/1.1853496
2005-01-28
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Simulation of adsorption-induced stress of a microcantilever sensor
http://aip.metastore.ingenta.com/content/aip/journal/jap/97/4/10.1063/1.1853496
10.1063/1.1853496
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