Typical XRD pattern measured for the surface parallel to the casting plane of sample 1 RTGG-UP ceramic.
Experimental and Gaussian fitted profile of the (003) diffraction peak of for various angles (sample 1).
-angle dependence of distribution density for the RTGG-UP samples.
Experimental and refined XRD patterns at different positions for sample 3. Dotted lines represent measured diffraction intensities; solid lines represent fitted curves.
Calculated (003) pole figures for different uniaxial pressing duration times of (a) , (b) , and (c) ; the figures are represented in equal area projections, and linear density scale.
Calculated inverse pole figures of sample 1 derived from the ODF for the direction normal to the casting plane (fiber axis of the texture). (a) Equal area projections, linear density scale. (b) Equal area projections, logarithmic density scale. (c) Inverse pole figure scheme with crystallographic structure directions.
Uniaxial pressing duration time dependence of electrical conductivity (▵) and power factor (●).
, FWHM, and texture index values for different uniaxial pressures and duration times.
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