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Charge-carrier properties in synthetic single-crystal diamond measured with the transient-current technique
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10.1063/1.1863417
/content/aip/journal/jap/97/7/10.1063/1.1863417
http://aip.metastore.ingenta.com/content/aip/journal/jap/97/7/10.1063/1.1863417
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Diamond dark current as a function of applied voltage.

Image of FIG. 2.
FIG. 2.

Setup used for amplification of CVD diamond current signals.

Image of FIG. 3.
FIG. 3.

Diamond current pulses for holes (a) with different negative bias voltages applied to the detector back contact and for electrons (b) with different positive bias voltages .

Image of FIG. 4.
FIG. 4.

Average drift velocity (a) and mobility (b) as a function of applied drift field . The solid marker denote electrons and the open markers denote holes. The solid lines in (a) show fits of Eq. (7) to the data. The solid lines in (b) are only for visual guidance.

Image of FIG. 5.
FIG. 5.

Total induced charge for electrons (solid markers) and holes (open markers) as a function of applied drift voltage.

Image of FIG. 6.
FIG. 6.

Measured ionization charge for electrons (solid markers) and holes (open markers) as a function of inverse drift velocity.

Image of FIG. 7.
FIG. 7.

Corrected charge as a function of drift voltage for electrons (a) and holes (b) with different choices of .

Image of FIG. 8.
FIG. 8.

Slope of as a function of .

Image of FIG. 9.
FIG. 9.

Hole pulses for , and (bottom to top amplitude). The insert shows a schematic representation of a possible electric field with .

Image of FIG. 10.
FIG. 10.

Total integrated hole charge as a function of . The dashed line indicates the fit to determine .

Image of FIG. 11.
FIG. 11.

Base line corrected measured current pulses (markers) and simulated current pulses (lines) for holes (plot a) and electrons (plot b).

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/content/aip/journal/jap/97/7/10.1063/1.1863417
2005-03-21
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Charge-carrier properties in synthetic single-crystal diamond measured with the transient-current technique
http://aip.metastore.ingenta.com/content/aip/journal/jap/97/7/10.1063/1.1863417
10.1063/1.1863417
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