X-ray diffraction patterns of (222) refraction for films grown using neutral clusters at different substrate temperatures. The inset shows the pattern of the film grown at
X-ray diffraction patterns of (222) refraction for films grown by different acceleration voltages of ionized GeTe cluster at .
Acceleration voltage of GeTe or MnTe ionized clusters dependence of FWHM of x-ray scan for films. The closed circles and triangles show the films grown using ionized MnTe or GeTe clusters at , respectively. The open circles show FWHM of the film grown using neutral clusters at .
High-resolution SEM images of surface morphology of films. (a) 1384: neutral GeTe and MnTe clusters at , (b) I415: ionized MnTe cluster at , , and , and (c) 1439: ionized GeTe cluster at , , and .
Magnetization curves deduced from magnetotransport measurements at . The magnetic field was applied perpendicular to the film plane.
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