Nitrogen concentration revealed by XPS as a function of nitrogen pressure.
Deconvolution of the C and N spectra of films at different nitrogen concentrations.
Deconvolution of the C envelopes of -C films at two different laser fluences.
Curve fitting results of the C spectra plotted as a function of laser fluence.
Raman spectra at 514-nm excitation of films prepared at different nitrogen contents.
ratios at 514- and 633-nm excitation wavelengths as a function of nitrogen content.
FWHM of the peak as a function of nitrogen.
peak position as a function of nitrogen content.
The Raman spectra of films prepared at various laser fluences.
ratio of films prepared at various laser fluences.
FWHM of peak as a function of laser fluence.
FTIR absorption spectra of films with different nitrogen concentrations.
SEM images of samples prepared at (a) and (b) at .
Hardness and elastic modulus values as a function of indentation depth for films containing various nitrogen contents.
PLD parameters used for the synthesis of -C and films.
The C bonding areas and peak widths of films.
The N bonding areas and peak widths of films.
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