Physical and electronic configurations of the shear-modulated nanoindentation technique used for measuring thermal transitions of polymer films. (1) Hysitron Triboscope (capacitive load-displacement transducer). (2) Thin-film detector temperature sensor. (3) Polymer film sample. (4) Sample substrate (silicon). (5) Copper disk. (6) Thermoelectric heater. (7) Macor heater housing. (8) Piezoelectric tube scanner of a Topometrix Discoverer SFM. Outtake: Schematic illustrating the indenter plate in the capacitive transducer (indenter normal spring constant).
Modulated nanoindention results for PtBA with an average heating rate of . (hemispherical tungsten indenter; , modulation frequency , and modulation amplitude ). A value of is indicated by the discontinuous rise in the normal response.
(a) Shear-modulated force microscopy (SM-FM) results on the same PtBA film indicate a of ( , modulation frequency , and modulation amplitude ). (b) Differential scanning calorimetry (DSC) results for bulk PtBA indicate a of approximately 40 °C.
Modulated nanoindention results for PtBA, with an average heating of . (hemispherical tungsten indenter; , modulation frequency , and modulation amplitude ). A value of is indicated by the discrete step in the normal response.
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