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Spectroscopic ellipsometry study of superlattices
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10.1063/1.2136427
/content/aip/journal/jap/98/10/10.1063/1.2136427
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/10/10.1063/1.2136427
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SE pseudodielectric functions and of thin films for Mn concentration , 0.4, and 0.6, with the PL spectrum for a sample with .

Image of FIG. 2.
FIG. 2.

SE pseudodielectric functions and and PL spectra of SL sample 505.

Image of FIG. 3.
FIG. 3.

SE pseudodielectric functions and and PL spectra of SL sample 506.

Image of FIG. 4.
FIG. 4.

SE pseudodielectric functions and and PL spectra of SL sample 503.

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/content/aip/journal/jap/98/10/10.1063/1.2136427
2005-11-28
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spectroscopic ellipsometry study of Cd1−xMnxTe∕CdTe superlattices
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/10/10.1063/1.2136427
10.1063/1.2136427
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