1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Depth profile of strain and composition in dot multilayers by microscopic phonon Raman spectroscopy
Rent:
Rent this article for
USD
10.1063/1.2140078
/content/aip/journal/jap/98/11/10.1063/1.2140078
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/11/10.1063/1.2140078
/content/aip/journal/jap/98/11/10.1063/1.2140078
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/jap/98/11/10.1063/1.2140078
2005-12-09
2014-10-25
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Depth profile of strain and composition in Si∕Ge dot multilayers by microscopic phonon Raman spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/11/10.1063/1.2140078
10.1063/1.2140078
SEARCH_EXPAND_ITEM